Correction of dynamic characteristics of temperature measuring devices

O. Boyko; O. Hotra

doi:10.1117/12.2501553

1 October 2018 Correction of dynamic characteristics of temperature measuring devices

O. Boyko, O. Hotra

Proceedings Volume 10808, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2018; 1080858 (2018) https://doi.org/10.1117/12.2501553
Event: Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2018, 2018, Wilga, Poland

Abstract

The correction method of dynamic characteristics of temperature measuring devices is proposed. It is based on the measurement of the RTD’s resistance value at a certain moment of the beginning of the transition process with subsequent calculation (by developed algorithm) of the given RTD’s resistance value corresponding to the measured temperature value. The structural scheme of the thermoresistive converter with the RTD pre-heating to the initial temperature value of the measuring range and with microprocessor calculation of the measured temperature value has been developed. The accuracy of temperature determination in this case is mainly determined by the accuracy of temperature measurement at a time instant t of the transition process beginning chosen less than the time constant of the RTD t <τ . It has been found that the proposed temperature measuring device provides the measurement accuracy of 0.05 °C at the measurement time t=0.1τ.

Citation Download Citation

O. Boyko and O. Hotra "Correction of dynamic characteristics of temperature measuring devices ", Proc. SPIE 10808, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2018, 1080858 (1 October 2018); https://doi.org/10.1117/12.2501553

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