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22 September 1993 Data linearization method for perpendicularity measurement
Hua Li, Pengsheng Li, Huijie Zhao, Jun Niu
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Proceedings Volume 2101, Measurement Technology and Intelligent Instruments; (1993) https://doi.org/10.1117/12.156472
Event: Measurement Technology and Intelligent Instruments, 1993, Wuhan, China
Abstract
Perpendicularity is one of the important parameters to determine the location of parts and to assure the accuracy of machine. The perpendicularity is measured using the method of location measurement. And its reliability and accuracy can be decided according to their relation.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
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Hua Li, Pengsheng Li, Huijie Zhao, and Jun Niu "Data linearization method for perpendicularity measurement", Proc. SPIE 2101, Measurement Technology and Intelligent Instruments, (22 September 1993); https://doi.org/10.1117/12.156472
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KEYWORDS
Reliability
Error analysis
Statistical analysis
Lithium
Inspection
Quantum efficiency
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