Paper
25 September 1998 New method for extracting ellipses
Yun Fan, Runsheng Wang
Author Affiliations +
Proceedings Volume 3545, International Symposium on Multispectral Image Processing (ISMIP'98); (1998) https://doi.org/10.1117/12.323647
Event: International Symposium on Multispectral Image Processing, 1998, Wuhan, China
Abstract
In this paper, a new method for extracting ellipses from an image is presented. It includes two steps, finding the candidate regions and rectifying the detected regions' position, estimating the ellipses' parameters. It's calculation amount is less than many other methods, and it is very immune to the noise. Specially, it has strong ability to extract multi incomplete and concentric ellipses from an image.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yun Fan and Runsheng Wang "New method for extracting ellipses", Proc. SPIE 3545, International Symposium on Multispectral Image Processing (ISMIP'98), (25 September 1998); https://doi.org/10.1117/12.323647
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KEYWORDS
Hough transforms

Error analysis

Defense technologies

Image analysis

Shape analysis

Signal to noise ratio

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