Paper
16 May 2003 Adaptive pixel defect correction
Author Affiliations +
Abstract
Although the number of pixels in image sensors is increasing exponentially, production techniques have only been able to linearly reduce the probability that a pixel will be defective. The result is a rapidly increasing probability that a sensor will contain one or more defective pixels. Sensors with defects are often discarded after fabrication because they may not produce aesthetically pleasing images. To reduce the cost of image sensor production, defect correction algorithms are needed that allow the utilization of sensors with bad pixels. We present a relatively simple defect correction algorithm, requiring only a small 7 by 7 kernel of raw color filter array data that effectively corrects a wide variety of defect types. Our adaptive edge algorithm is high quality, uses few image lines, is adaptable to a variety of defect types, and independent of other on-board DSP algorithms. Results show that the algorithm produces substantially better results in high-frequency image regions compared to conventional one-dimensional correction methods.
© (2003) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Anthony A. Tanbakuchi, Arjen van der Sijde, Bart Dillen, Albert J. P. Theuwissen, and Wim de Haan "Adaptive pixel defect correction", Proc. SPIE 5017, Sensors and Camera Systems for Scientific, Industrial, and Digital Photography Applications IV, (16 May 2003); https://doi.org/10.1117/12.499223
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CITATIONS
Cited by 27 scholarly publications and 1 patent.
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KEYWORDS
Image sensors

Detection and tracking algorithms

Sensors

Digital signal processing

Reconstruction algorithms

Image quality

Error analysis

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