Paper
30 May 2013 Optical characterization of amber specimens from the unique collection of the Museum of the Earth of the Polish Academy of Sciences in Warsaw
A. Zatorska, B. Kosmowska-Ceranowicz, A. Koss, J. Marczak, A. Sarzyński, M. Strzelec, W. Skrzeczanowski
Author Affiliations +
Abstract
The paper presents examination methodology and results of identification tests and conservation treatments of amber specimens and prepared amber samples, selected from a large collection of the Museum of the Earth of Polish Academy of Sciences in Warsaw. Particular attention has been paid to the use of noninvasive methods of topographic and material analyses. Optimized conservation treatment has been applied to consolidate, store and exhibit a set of archaeological amber beads from the National Archaeological Museum in Warsaw.
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A. Zatorska, B. Kosmowska-Ceranowicz, A. Koss, J. Marczak, A. Sarzyński, M. Strzelec, and W. Skrzeczanowski "Optical characterization of amber specimens from the unique collection of the Museum of the Earth of the Polish Academy of Sciences in Warsaw", Proc. SPIE 8790, Optics for Arts, Architecture, and Archaeology IV, 879012 (30 May 2013); https://doi.org/10.1117/12.2020225
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KEYWORDS
Polishing

Photography

Scanning electron microscopy

Principal component analysis

Surface finishing

Absorption

Electron microscopes

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