Space based optical staring sensor LOS determination and calibration using GCPs observation

Jun Chen; Wei An; Xinpu Deng; Jungang Yang; Zhichao Sha

doi:10.1117/12.2240285

21 October 2016 Space based optical staring sensor LOS determination and calibration using GCPs observation

Jun Chen, Wei An, Xinpu Deng, Jungang Yang, Zhichao Sha

Proceedings Volume 9987, Electro-Optical and Infrared Systems: Technology and Applications XIII; 99870Y (2016) https://doi.org/10.1117/12.2240285
Event: SPIE Security + Defence, 2016, Edinburgh, United Kingdom

Abstract

Line of sight (LOS) attitude determination and calibration is the key prerequisite of tracking and location of targets in space based infrared (IR) surveillance systems (SBIRS) and the LOS determination and calibration of staring sensor is one of the difficulties. This paper provides a novel methodology for removing staring sensor bias through the use of Ground Control Points (GCPs) detected in the background field of the sensor. Based on researching the imaging model and characteristics of the staring sensor of SBIRS geostationary earth orbit part (GEO), the real time LOS attitude determination and calibration algorithm using landmark control point is proposed. The influential factors (including the thermal distortions error, assemble error, and so on) of staring sensor LOS attitude error are equivalent to bias angle of LOS attitude. By establishing the observation equation of GCPs and the state transition equation of bias angle, and using an extend Kalman filter (EKF), the real time estimation of bias angle and the high precision sensor LOS attitude determination and calibration are achieved. The simulation results show that the precision and timeliness of the proposed algorithm meet the request of target tracking and location process in space based infrared surveillance system.

Citation Download Citation

Jun Chen, Wei An, Xinpu Deng, Jungang Yang, and Zhichao Sha "Space based optical staring sensor LOS determination and calibration using GCPs observation", Proc. SPIE 9987, Electro-Optical and Infrared Systems: Technology and Applications XIII, 99870Y (21 October 2016); https://doi.org/10.1117/12.2240285

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