Kacper Gworek
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 October 2018 Paper
Proceedings Volume 10808, 108080U (2018) https://doi.org/10.1117/12.2501582
KEYWORDS: Refractive index, Polymers, Thin films, Temperature metrology, Sensors, Gas sensors, Atmospheric optics, Spectroscopic ellipsometry, Optical properties, Polymer thin films, Polymeric sensors, Conductive coatings

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