PROCEEDINGS VOLUME 2261
SPIE'S 1994 INTERNATIONAL SYMPOSIUM ON OPTICS, IMAGING, AND INSTRUMENTATION | 24-29 JULY 1994
Optical System Contamination: Effects, Measurements, and Control IV
Editor(s): A. Peter M. Glassford
Editor Affiliations +
IN THIS VOLUME

4 Sessions, 31 Papers, 0 Presentations
Flight Data  (8)
SPIE'S 1994 INTERNATIONAL SYMPOSIUM ON OPTICS, IMAGING, AND INSTRUMENTATION
24-29 July 1994
San Diego, CA, United States
Flight Data
Patricia A. Hansen, Randy J. Hedgeland, Carl R. Maag, Calvin H. Seaman
Proceedings Volume Optical System Contamination: Effects, Measurements, and Control IV, (1994) https://doi.org/10.1117/12.190131
Randy J. Hedgeland, Patricia A. Hansen, David W. Hughes
Proceedings Volume Optical System Contamination: Effects, Measurements, and Control IV, (1994) https://doi.org/10.1117/12.190141
Randy J. Hedgeland, Barry N. Greenberg, Wayne C. Geer, Joe Hammerbacher, Leon Bailey, John DiBartolo, Don Gabbert
Proceedings Volume Optical System Contamination: Effects, Measurements, and Control IV, (1994) https://doi.org/10.1117/12.190152
William J. Mitchell
Proceedings Volume Optical System Contamination: Effects, Measurements, and Control IV, (1994) https://doi.org/10.1117/12.190156
David W. Hughes, Randy J. Hedgeland, Wayne C. Geer, Barry N. Greenberg
Proceedings Volume Optical System Contamination: Effects, Measurements, and Control IV, (1994) https://doi.org/10.1117/12.190157
David F. Hall
Proceedings Volume Optical System Contamination: Effects, Measurements, and Control IV, (1994) https://doi.org/10.1117/12.190158
Charles C. Lorentson, Laura Ottenstein, Philip T. C. Chen, Rose T. Rodriguez
Proceedings Volume Optical System Contamination: Effects, Measurements, and Control IV, (1994) https://doi.org/10.1117/12.190159
Steve C. Kwan, Loren C. Zumwalt, Aleck L. Lee
Proceedings Volume Optical System Contamination: Effects, Measurements, and Control IV, (1994) https://doi.org/10.1117/12.190160
Analytical Studies
Proceedings Volume Optical System Contamination: Effects, Measurements, and Control IV, (1994) https://doi.org/10.1117/12.190161
Kenneth T. Luey, Joseph C. Uht
Proceedings Volume Optical System Contamination: Effects, Measurements, and Control IV, (1994) https://doi.org/10.1117/12.190132
Robert E. Erlandson, N. A. Gatsonis
Proceedings Volume Optical System Contamination: Effects, Measurements, and Control IV, (1994) https://doi.org/10.1117/12.190133
William T. Bertrand, Bob E. Wood, Kent F. Palmer
Proceedings Volume Optical System Contamination: Effects, Measurements, and Control IV, (1994) https://doi.org/10.1117/12.190134
Michael C. Fong, Aleck L. Lee
Proceedings Volume Optical System Contamination: Effects, Measurements, and Control IV, (1994) https://doi.org/10.1117/12.190135
Timothy J. Girard, Richard M. Payton
Proceedings Volume Optical System Contamination: Effects, Measurements, and Control IV, (1994) https://doi.org/10.1117/12.190136
David M. Silver, Richard C. Benson, Jeffrey W. Garrett, A. Peter M. Glassford
Proceedings Volume Optical System Contamination: Effects, Measurements, and Control IV, (1994) https://doi.org/10.1117/12.190137
MSX Contamination Experiment
Bryan L. Seiber, Robert J. Bryson, Bob E. Wood
Proceedings Volume Optical System Contamination: Effects, Measurements, and Control IV, (1994) https://doi.org/10.1117/12.190138
Robert E. Erlandson, Mark T. Boies, O. Manuel Uy, J. M. Grebowsky, Jack T. Coulson
Proceedings Volume Optical System Contamination: Effects, Measurements, and Control IV, (1994) https://doi.org/10.1117/12.190139
C. Brent Bargeron, Terry E. Phillips, Richard C. Benson
Proceedings Volume Optical System Contamination: Effects, Measurements, and Control IV, (1994) https://doi.org/10.1117/12.190140
Jeffrey C. Lesho, O. Manuel Uy, Douglas Mehoke, Bob E. Wood
Proceedings Volume Optical System Contamination: Effects, Measurements, and Control IV, (1994) https://doi.org/10.1117/12.190142
Mark T. Boies, Richard C. Benson, James D. Kinnison, John S. Morgan, Terry E. Phillips, O. Manuel Uy, William L. Wilkinson
Proceedings Volume Optical System Contamination: Effects, Measurements, and Control IV, (1994) https://doi.org/10.1117/12.190143
Gary E. Galica, John J. Atkinson, Giuseppe Aurilio, Orr Shepherd, Jeffrey C. Lesho, Mark T. Boies, Kevin J. Heffernan, Patrick J. McEvaddy, O. Manuel Uy
Proceedings Volume Optical System Contamination: Effects, Measurements, and Control IV, (1994) https://doi.org/10.1117/12.190144
B. David Green, Phillip A. Mulhall
Proceedings Volume Optical System Contamination: Effects, Measurements, and Control IV, (1994) https://doi.org/10.1117/12.190145
James S. Dyer, Russell S. Mikesell, Radford L. Perry, Tracy Mikesell, James J. Guregian
Proceedings Volume Optical System Contamination: Effects, Measurements, and Control IV, (1994) https://doi.org/10.1117/12.190146
Contaminant Measurement and Removal
Robert J. Bryson, Bryan L. Seiber, William T. Bertrand, John H. Jones, Bob E. Wood, Jeffrey C. Lesho
Proceedings Volume Optical System Contamination: Effects, Measurements, and Control IV, (1994) https://doi.org/10.1117/12.190147
Donald A. Wallace, William D. Bowers
Proceedings Volume Optical System Contamination: Effects, Measurements, and Control IV, (1994) https://doi.org/10.1117/12.190148
A. Peter M. Glassford, Jeffrey W. Garrett, William D. Bowers
Proceedings Volume Optical System Contamination: Effects, Measurements, and Control IV, (1994) https://doi.org/10.1117/12.190149
Richard Fedors
Proceedings Volume Optical System Contamination: Effects, Measurements, and Control IV, (1994) https://doi.org/10.1117/12.190150
Proceedings Volume Optical System Contamination: Effects, Measurements, and Control IV, (1994) https://doi.org/10.1117/12.190151
Malina M. Hills
Proceedings Volume Optical System Contamination: Effects, Measurements, and Control IV, (1994) https://doi.org/10.1117/12.190153
Proceedings Volume Optical System Contamination: Effects, Measurements, and Control IV, (1994) https://doi.org/10.1117/12.190154
Herbert C. Bitting
Proceedings Volume Optical System Contamination: Effects, Measurements, and Control IV, (1994) https://doi.org/10.1117/12.190155
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