PROCEEDINGS VOLUME 2665
ELECTRONIC IMAGING: SCIENCE AND TECHNOLOGY | 28 JANUARY - 2 FEBRUARY 1996
Machine Vision Applications in Industrial Inspection IV
Editor(s): A. Ravishankar Rao, Ning Chang
Editor Affiliations +
IN THIS VOLUME

8 Sessions, 26 Papers, 0 Presentations
Algorithms I  (2)
3D Vision I  (3)
3D Vision II  (4)
ELECTRONIC IMAGING: SCIENCE AND TECHNOLOGY
28 January - 2 February 1996
San Jose, CA, United States
Vision Systems I
Proceedings Volume Machine Vision Applications in Industrial Inspection IV, (1996) https://doi.org/10.1117/12.232229
Graham A. Jullien, QiuPing Li, S. Hossain Hajimowlana, J. Morvay, D. Conflitti, James W. Roberts, Brian C. Doody
Proceedings Volume Machine Vision Applications in Industrial Inspection IV, (1996) https://doi.org/10.1117/12.232239
Hyun Sik Ahn, Chin Tae Choi, Kwan Hee Lee, Yeong-Ho Ha
Proceedings Volume Machine Vision Applications in Industrial Inspection IV, (1996) https://doi.org/10.1117/12.232248
Carlos Platero, Carlos Fernandez, Pascual Campoy, Rafael Aracil
Proceedings Volume Machine Vision Applications in Industrial Inspection IV, (1996) https://doi.org/10.1117/12.232250
Algorithms I
Chi-Hsien Victor Shih, Nasser Sherkat, Peter D. Thomas
Proceedings Volume Machine Vision Applications in Industrial Inspection IV, (1996) https://doi.org/10.1117/12.232251
Erhard Schubert, Axel Schroeder
Proceedings Volume Machine Vision Applications in Industrial Inspection IV, (1996) https://doi.org/10.1117/12.232252
3D Vision I
Gunter Bellaire, Karsten Schluens, K. Oppermann, W. Schimke
Proceedings Volume Machine Vision Applications in Industrial Inspection IV, (1996) https://doi.org/10.1117/12.232253
Ji-Chun Lee, Kuang-Chao Fan
Proceedings Volume Machine Vision Applications in Industrial Inspection IV, (1996) https://doi.org/10.1117/12.232254
Bo Liu, Liying Wu, Jian Zhang, Qi-Shan Wang
Proceedings Volume Machine Vision Applications in Industrial Inspection IV, (1996) https://doi.org/10.1117/12.232230
Texture-Based Methods
Hubert Konik, Bernard Laget, Bernard Redortier, Maurice Calonnier
Proceedings Volume Machine Vision Applications in Industrial Inspection IV, (1996) https://doi.org/10.1117/12.232231
Maria Tafuri, Antonella Branca, Giovanni Attolico, Arcangelo Distante, William Delaney
Proceedings Volume Machine Vision Applications in Industrial Inspection IV, (1996) https://doi.org/10.1117/12.232232
Jean-Louis Alexief, Naceur Kerkeni, Jean-Claude Angue
Proceedings Volume Machine Vision Applications in Industrial Inspection IV, (1996) https://doi.org/10.1117/12.232233
Alain Tremeau, Julien Bousigue, Bernard Laget
Proceedings Volume Machine Vision Applications in Industrial Inspection IV, (1996) https://doi.org/10.1117/12.232234
3D Vision II
Michael H. Reich, Russell Allan
Proceedings Volume Machine Vision Applications in Industrial Inspection IV, (1996) https://doi.org/10.1117/12.232235
Proceedings Volume Machine Vision Applications in Industrial Inspection IV, (1996) https://doi.org/10.1117/12.232236
Wolfram Kleuver, Michael Fuss
Proceedings Volume Machine Vision Applications in Industrial Inspection IV, (1996) https://doi.org/10.1117/12.232237
Lester A. Gerhardt, Kwangik Hyun
Proceedings Volume Machine Vision Applications in Industrial Inspection IV, (1996) https://doi.org/10.1117/12.232238
PCB Inspection
Mandava Rajeswari, Mike G. Rodd
Proceedings Volume Machine Vision Applications in Industrial Inspection IV, (1996) https://doi.org/10.1117/12.232240
Madhav Moganti, Fikret Ercal, Venkatkrishna Yellepeddy
Proceedings Volume Machine Vision Applications in Industrial Inspection IV, (1996) https://doi.org/10.1117/12.232241
Algorithms II
Natasha Gorte-Kroupnova, Ben G.H. Gorte
Proceedings Volume Machine Vision Applications in Industrial Inspection IV, (1996) https://doi.org/10.1117/12.232242
Martin A. Hunt, J. Steve Hicks, Shaun S. Gleason
Proceedings Volume Machine Vision Applications in Industrial Inspection IV, (1996) https://doi.org/10.1117/12.232243
Heon Hwang, Bosoon Park, Minh Duc Nguyen, Yud-Ren Chen
Proceedings Volume Machine Vision Applications in Industrial Inspection IV, (1996) https://doi.org/10.1117/12.232244
Vision Systems II
Proceedings Volume Machine Vision Applications in Industrial Inspection IV, (1996) https://doi.org/10.1117/12.232245
David R. Patek, Kenneth W. Tobin Jr., L. Jachter
Proceedings Volume Machine Vision Applications in Industrial Inspection IV, (1996) https://doi.org/10.1117/12.232246
Jamshid Dehmeshki, Mohammad Farhang Daemi, N. J. Miles, B. P. Atkin
Proceedings Volume Machine Vision Applications in Industrial Inspection IV, (1996) https://doi.org/10.1117/12.232247
Jean Caron, Luc Duvieubourg, Jean-Jose Orteu, Ph. Revolte
Proceedings Volume Machine Vision Applications in Industrial Inspection IV, (1996) https://doi.org/10.1117/12.232249
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