PROCEEDINGS VOLUME 3285
OPTOELECTRONICS AND HIGH-POWER LASERS AND APPLICATIONS | 24-30 JANUARY 1998
Fabrication, Testing, Reliability, and Applications of Semiconductor Lasers III
Editor Affiliations +
OPTOELECTRONICS AND HIGH-POWER LASERS AND APPLICATIONS
24-30 January 1998
San Jose, CA, United States
Fabrication of Semiconductor Lasers
Mutsuo Ogura, Seiji Ikawa
Proceedings Volume Fabrication, Testing, Reliability, and Applications of Semiconductor Lasers III, (1998) https://doi.org/10.1117/12.307591
Manijeh Razeghi
Proceedings Volume Fabrication, Testing, Reliability, and Applications of Semiconductor Lasers III, (1998) https://doi.org/10.1117/12.307610
Hiroshi Iwata, Koichi Naniwae, Kenichiro Yashiki
Proceedings Volume Fabrication, Testing, Reliability, and Applications of Semiconductor Lasers III, (1998) https://doi.org/10.1117/12.307611
Proceedings Volume Fabrication, Testing, Reliability, and Applications of Semiconductor Lasers III, (1998) https://doi.org/10.1117/12.307612
Akihiro Shima, Misao Hironaka, Ken-ichi Ono, Masayoshi Takemi, Yoshifumi Sakamoto, Yasuhiro Kunitsugu, Koji Yamashita
Proceedings Volume Fabrication, Testing, Reliability, and Applications of Semiconductor Lasers III, (1998) https://doi.org/10.1117/12.307613
Diode Laser Characterization and Testing
Proceedings Volume Fabrication, Testing, Reliability, and Applications of Semiconductor Lasers III, (1998) https://doi.org/10.1117/12.307614
Dror Sarid, Xiaowei Yao, Richard K. Workman, Charles A. Peterson, Mahmoud Fallahi
Proceedings Volume Fabrication, Testing, Reliability, and Applications of Semiconductor Lasers III, (1998) https://doi.org/10.1117/12.307615
Nien Hua Lu, Din Ping Tsai, F. C. Yeh, C. S. Chang, T. T. Tsong, Man-Fang Huang, C. J. Liu
Proceedings Volume Fabrication, Testing, Reliability, and Applications of Semiconductor Lasers III, (1998) https://doi.org/10.1117/12.307592
Proceedings Volume Fabrication, Testing, Reliability, and Applications of Semiconductor Lasers III, (1998) https://doi.org/10.1117/12.307593
Reliability of Semiconductor Lasers
Tsuyoshi Fujimoto, Yoshikazu Yamada, Yasuo Oeda, Atsushi Okubo, Yumi Yamada, Kiyofumi Muro
Proceedings Volume Fabrication, Testing, Reliability, and Applications of Semiconductor Lasers III, (1998) https://doi.org/10.1117/12.307594
Proceedings Volume Fabrication, Testing, Reliability, and Applications of Semiconductor Lasers III, (1998) https://doi.org/10.1117/12.307595
Benjamin Li, Gary L. Harnagel, Richard R. Craig
Proceedings Volume Fabrication, Testing, Reliability, and Applications of Semiconductor Lasers III, (1998) https://doi.org/10.1117/12.307596
Laser Diodes for Display Applications
James T. Veligdan, Leo Beiser, Cyrus Biscardi, Calvin Brewster, Leonard DeSanto
Proceedings Volume Fabrication, Testing, Reliability, and Applications of Semiconductor Lasers III, (1998) https://doi.org/10.1117/12.307597
David E. Hargis, Robert Bergstedt, Allen M. Earman, Paul Gullicksen, Randy Hurtado, Arthur P. Minich, Sven E. Nelte, David P. Ornelas, Maurice A. Pessot, et al.
Proceedings Volume Fabrication, Testing, Reliability, and Applications of Semiconductor Lasers III, (1998) https://doi.org/10.1117/12.307598
Stephan Teiwes, Jannett Guhr, Andreas Mitreiter, Leonore Zimmermann
Proceedings Volume Fabrication, Testing, Reliability, and Applications of Semiconductor Lasers III, (1998) https://doi.org/10.1117/12.307599
Robert J. Martinsen, Masayuki Karakawa, Stephen R. McDowell, Keith W. Kennedy, Andrew J. Radl
Proceedings Volume Fabrication, Testing, Reliability, and Applications of Semiconductor Lasers III, (1998) https://doi.org/10.1117/12.307600
Laser Diodes for Spectroscopy
Claire F. Gmachl, Federico Capasso, Jerome Faist, Deborah L. Sivco, James N. Baillargeon, Albert L. Hutchinson, Alfred Y. Cho, Khosrow Namjou, Simin Cai, et al.
Proceedings Volume Fabrication, Testing, Reliability, and Applications of Semiconductor Lasers III, (1998) https://doi.org/10.1117/12.307601
Alan Fried, Bryan P. Wert, Bruce E. Henry, James R. Drummond
Proceedings Volume Fabrication, Testing, Reliability, and Applications of Semiconductor Lasers III, (1998) https://doi.org/10.1117/12.307602
Proceedings Volume Fabrication, Testing, Reliability, and Applications of Semiconductor Lasers III, (1998) https://doi.org/10.1117/12.307603
High-Power Laser Diodes for Printing and Illumination
Michael A. Marinelli, Jeffrey T. Remillard
Proceedings Volume Fabrication, Testing, Reliability, and Applications of Semiconductor Lasers III, (1998) https://doi.org/10.1117/12.307604
Eric C. Honea, Jay A. Skidmore, Barry L. Freitas, Everett J. Utterback, Mark A. Emanuel
Proceedings Volume Fabrication, Testing, Reliability, and Applications of Semiconductor Lasers III, (1998) https://doi.org/10.1117/12.307605
Diode Lasers with Fiber Applications
Proceedings Volume Fabrication, Testing, Reliability, and Applications of Semiconductor Lasers III, (1998) https://doi.org/10.1117/12.307606
Chung Y. Wu, Chang-Zhi Guo, Jing Ming Xu
Proceedings Volume Fabrication, Testing, Reliability, and Applications of Semiconductor Lasers III, (1998) https://doi.org/10.1117/12.307607
Stephen G. Ayling, David R. Wight, Michael Allenson, Keith P. Hilton, Gilbert W. Smith
Proceedings Volume Fabrication, Testing, Reliability, and Applications of Semiconductor Lasers III, (1998) https://doi.org/10.1117/12.307608
Alan Johnstone, Meirion F. Lewis, Jonathan D. Hares
Proceedings Volume Fabrication, Testing, Reliability, and Applications of Semiconductor Lasers III, (1998) https://doi.org/10.1117/12.307609
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