PROCEEDINGS VOLUME 8851
SPIE OPTICAL ENGINEERING + APPLICATIONS | 25-29 AUGUST 2013
X-Ray Nanoimaging: Instruments and Methods
Editor(s): Barry Lai
Editor Affiliations +
Proceedings Volume 8851 is from: Logo
SPIE OPTICAL ENGINEERING + APPLICATIONS
25-29 August 2013
San Diego, California, United States
Front Matter: Volume 8851
Proceedings Volume X-Ray Nanoimaging: Instruments and Methods, 885101 (2013) https://doi.org/10.1117/12.2045770
Scanning Probes I
Si Chen, Ye Yuan, Junjing Deng, Rachel Mak, Qiaoling Jin, Tatjana Paunesku, Sophie C. Gleber, David Vine, Claus Flachenecker, et al.
Proceedings Volume X-Ray Nanoimaging: Instruments and Methods, 885102 (2013) https://doi.org/10.1117/12.2025169
A. Somogyi, K. Medjoubi, C. M. Kewish, V. Leroux, M. Ribbens, G. Baranton, F. Polack, J. P. Samama
Proceedings Volume X-Ray Nanoimaging: Instruments and Methods, 885104 (2013) https://doi.org/10.1117/12.2027086
Jörg Maser, Barry Lai, Tonio Buonassisi, Zhonghou Cai, Si Chen, Lydia Finney, Sophie-Charlotte Gleber, Ross Harder, Chris Jacobsen, et al.
Proceedings Volume X-Ray Nanoimaging: Instruments and Methods, 885106 (2013) https://doi.org/10.1117/12.2026418
Full-Field Microscopes
S. Matsuyama, Y. Emi, H. Kino, Y. Sano, Y. Kohmura, K. Tamasaku, M. Yabashi, T. Ishikawa, K. Yamauchi
Proceedings Volume X-Ray Nanoimaging: Instruments and Methods, 885107 (2013) https://doi.org/10.1117/12.2023152
Yoshio Suzuki, Akihisa Takeuchi, Yasuko Terada, Kentaro Uesugi, Shigeharu Tamura
Proceedings Volume X-Ray Nanoimaging: Instruments and Methods, 885109 (2013) https://doi.org/10.1117/12.2025792
In-situ TXM Studies
Yijin Liu, Korneel H. Cats, Johanna Nelson Weker, Joy C. Andrews, Bert M. Weckhuysen, Piero Pianetta
Proceedings Volume X-Ray Nanoimaging: Instruments and Methods, 88510A (2013) https://doi.org/10.1117/12.2026436
Johanna Nelson, Yuan Yang, Sumohan Misra, Joy C. Andrews, Yi Cui, Michael F. Toney
Proceedings Volume X-Ray Nanoimaging: Instruments and Methods, 88510B (2013) https://doi.org/10.1117/12.2027263
Yu-chen K. Chen-Wiegart, Jiajun Wang, Jun Wang
Proceedings Volume X-Ray Nanoimaging: Instruments and Methods, 88510C (2013) https://doi.org/10.1117/12.2027095
Proceedings Volume X-Ray Nanoimaging: Instruments and Methods, 88510D (2013) https://doi.org/10.1117/12.2025842
Nanofocusing Optics
Proceedings Volume X-Ray Nanoimaging: Instruments and Methods, 88510G (2013) https://doi.org/10.1117/12.2026026
Scanning Probes II
Alke Meents, Bernd Reime, Nicolas Stuebe, Pontus Fischer, Martin Warmer, Dennis Goeries, Jan Roever, Jan Meyer, Janine Fischer, et al.
Proceedings Volume X-Ray Nanoimaging: Instruments and Methods, 88510K (2013) https://doi.org/10.1117/12.2027303
Ulf Johansson, Ulrich Vogt, Anders Mikkelsen
Proceedings Volume X-Ray Nanoimaging: Instruments and Methods, 88510L (2013) https://doi.org/10.1117/12.2026609
Zhonghou Cai, Wenjun Liu, Jonathan Z. Tischler, Deming Shu, Ruqing Xu, Oliver Schmidt
Proceedings Volume X-Ray Nanoimaging: Instruments and Methods, 88510M (2013) https://doi.org/10.1117/12.2025900
Fast Instrumentation
Kadda Medjoubi, Alain Bonissent, Nicolas Leclercq, Florent Langlois, Pascal Mercère, Andrea Somogyi
Proceedings Volume X-Ray Nanoimaging: Instruments and Methods, 88510P (2013) https://doi.org/10.1117/12.2026680
C. G. Ryan, D. P. Siddons, R. Kirkham, Z. Y. Li, M. D. de Jonge, D. Paterson, J. S. Cleverley, A. Kuczewski, P. A. Dunn, et al.
Proceedings Volume X-Ray Nanoimaging: Instruments and Methods, 88510Q (2013) https://doi.org/10.1117/12.2027195
Novel Nanoimaging Methods
Bo Chen, Brian Abbey, Eugeniu Balaur, Grant van Reissen, Mark Junker, Michael W. M. Jones, Andrew G. Peele, Corey T. Putkunz, David Vine, et al.
Proceedings Volume X-Ray Nanoimaging: Instruments and Methods, 88510T (2013) https://doi.org/10.1117/12.2027269
Lab-based Instruments
J. M. J. Madey, E. B. Szarmes, M. R. Hadmack, B. T. Jacobson, J. M. D. Kowalczyk, P. Niknejadi
Proceedings Volume X-Ray Nanoimaging: Instruments and Methods, 88510W (2013) https://doi.org/10.1117/12.2027193
Proceedings Volume X-Ray Nanoimaging: Instruments and Methods, 88510Y (2013) https://doi.org/10.1117/12.2026300
Poster Session
I. Mohacsi, P. Karvinen, I. Vartiainen, A. Diaz, A. Somogyi, C. M. Kewish, P. Mercere, C. David
Proceedings Volume X-Ray Nanoimaging: Instruments and Methods, 88510Z (2013) https://doi.org/10.1117/12.2022640
Yong Guan, Xin Pan, Gang Liu, Zhiting Liang, Shan Chen, Xiaobo Zhang, Ying Xiong, Yangchao Tian, Changrong Xia
Proceedings Volume X-Ray Nanoimaging: Instruments and Methods, 885112 (2013) https://doi.org/10.1117/12.2026149
Zhiting Liang, Yong Guan, Gang Liu, Rui Bian, Xiaobo Zhang, Ying Xiong, Yangchao Tian
Proceedings Volume X-Ray Nanoimaging: Instruments and Methods, 885113 (2013) https://doi.org/10.1117/12.2026153
Grant A. van Riessen, Mark Junker, Nicholas W. Phillips, Andrew G. Peele
Proceedings Volume X-Ray Nanoimaging: Instruments and Methods, 885117 (2013) https://doi.org/10.1117/12.2027211
Kahraman Keskinbora, Anna-Lena Robisch, Marcel Mayer, Corinne Grévent, Adriana V. Szeghalmi, Mato Knez, Markus Weigand, Irina Snigireva, Anatoly Snigirev, et al.
Proceedings Volume X-Ray Nanoimaging: Instruments and Methods, 885119 (2013) https://doi.org/10.1117/12.2027251
Biao Deng, Yuqi Ren, Yudan Wang, Guohao Du, Honglan Xie, Tiqiao Xiao
Proceedings Volume X-Ray Nanoimaging: Instruments and Methods, 88511D (2013) https://doi.org/10.1117/12.2035589
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