AC Phase Measurement Technique For Moire Interferograms

R. N. Shagam

doi:10.1117/12.936338

15 November 1983 AC Phase Measurement Technique For Moire Interferograms

R. N. Shagam

Proceedings Volume 0429, Precision Surface Metrology; (1983) https://doi.org/10.1117/12.936338
Event: 27th Annual Technical Symposium, 1983, San Diego, United States

Abstract

This paper describes a method by which recorded moire interferograms of diffuse, non optical surfaces may be processed using the principle of optical phase measurement by AC interferometry. In this method, a moire interferogram is recorded and processed as a transparency. The resulting interferogram is equivalent to a low spatial frequency optical hologram. An optical wavefront whose phase variations can be reconstructed from a plane wavefront and interfered with a second coherent plane wavefront of slightly different optical frequency, resulting in an interferogram appropriate for measurement by temporal electronic phase measurement. The results compare favorably to direct contact measurements.

Citation Download Citation

R. N. Shagam "AC Phase Measurement Technique For Moire Interferograms", Proc. SPIE 0429, Precision Surface Metrology, (15 November 1983); https://doi.org/10.1117/12.936338

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