High Resolution Electron Microscopy Study Of Silica Aerogel Transparent Insulation

J. H. Mazur; C. M. Lampert

doi:10.1117/12.944795

2 November 1984 High Resolution Electron Microscopy Study Of Silica Aerogel Transparent Insulation

J. H. Mazur, C. M. Lampert

Proceedings Volume 0502, Optical Materials Technology for Energy Efficiency and Solar Energy Conversion III; (1984) https://doi.org/10.1117/12.944795
Event: 28th Annual Technical Symposium, 1984, San Diego, United States

Abstract

The structure of silica aerogel was studied by transmission electron microscopy. The aerogel network consists of particles about 10.0 nm in diameter. The chemical composition of these aggregates was found to be a pure stoichiometric Si0; by both ESCA and Auger spectroscopy. These SiO2 groups appear to form a random network within each particle. The details of this arrangement have yet to be determined, because in this preliminary study, silica aerogel was found to transform after exposure to the intense electron beam.

Citation Download Citation

J. H. Mazur and C. M. Lampert "High Resolution Electron Microscopy Study Of Silica Aerogel Transparent Insulation", Proc. SPIE 0502, Optical Materials Technology for Energy Efficiency and Solar Energy Conversion III, (2 November 1984); https://doi.org/10.1117/12.944795

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