New Computer-Aided System For Automatic Fringe Analysis In Optical Metrologies

B Breuckmann; W Thieme

doi:10.1117/12.938296

17 November 1986 New Computer-Aided System For Automatic Fringe Analysis In Optical Metrologies

B Breuckmann, W Thieme

Proceedings Volume 0654, Automatic Optical Inspection; (1986) https://doi.org/10.1117/12.938296
Event: 1986 International Symposium/Innsbruck, 1986, Innsbruck, Austria

Abstract

A new computer-aided system for automatic fringe analysis will be presented. This commercially available system is based on the phase-shift method. It enables the complete analysis of fringe patterns for various optical measuring techniques: 2-beam interferometry, speckle-interferometry, holography, photoelasticity, fringe-projecting methods, and Moire techniques.

Citation Download Citation

B Breuckmann and W Thieme "New Computer-Aided System For Automatic Fringe Analysis In Optical Metrologies", Proc. SPIE 0654, Automatic Optical Inspection, (17 November 1986); https://doi.org/10.1117/12.938296

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