Paper
23 October 1986 Industrial Color Inspection
C S McCamy
Author Affiliations +
Abstract
Color is a very important property of many products and an essential feature of some. The commercial value of color is evident in the fact that customers reject product that is satisfactory in every other way, but is not the right color. Color isrumerically specified, measured, and controlled just as length or weight are. It has three dimensions: Hue, Value, and Chroma, and may be represented in a three-dimensional space. Colors of objects depend on the illumination and pairs of colors may match in one light but not in another. Controlled illumination is required for color matching. Illuminants were standardized by the International Commission on Illumination (CIE). As a basis for color measurement, the CIE adopted three spectral sensitivity functions representing a standard observer. Color may be measured by instruments using standard illumination and simulating the standard observer. It is better to measure spectral reflectance or transmittance and compute colorimetric quantities. Color may be inspected on a production line and the data obtained can be used to control the process. When production cannot be controlled as precisely as required, product may be sorted by color.
© (1986) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
C S McCamy "Industrial Color Inspection", Proc. SPIE 0665, Optical Techniques for Industrial Inspection, (23 October 1986); https://doi.org/10.1117/12.938756
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Tolerancing

Inspection

Process control

Computing systems

Visualization

Manufacturing

Colorimetry

RELATED CONTENT

The Scratch Standard Is Only A Cosmetic Standard
Proceedings of SPIE (December 20 1989)
Optical Inspection And Process Control
Proceedings of SPIE (May 08 1971)
Colorimetry Applications In The Automotive Industry
Proceedings of SPIE (November 04 1983)

Back to Top