Paper
31 March 1989 Automatic Fringe Pattern Analysis For Holographic Measurement Of Transient Event
M Kujawinska, D W Robinson
Author Affiliations +
Proceedings Volume 1026, Holography Techniques and Applications; (1989) https://doi.org/10.1117/12.950232
Event: 1988 International Congress on Optical Science and Engineering, 1988, Hamburg, Germany
Abstract
A modified optical system and computer image processing software is presented, to automate the analysis of holographic fringe patterns for applications in measurement of transient events is presented. Two fringe pattern analysis techniques are considered; a phase stepped method and a 2-D Fourier transform method. Both of them rely on spatial separation of phase information, although they are based on different physical principles. In the phase stepped method a grating is introduced into the holographic interferometer to separate three phase shifted images into the spatial domain instead of the time domain. In the Fourier transform method a spatial heterodyning frequency is added to the interferogram to isolate phase information in the spatial frequency domain. A comparison between the two methods is given, together with several refinements.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M Kujawinska and D W Robinson "Automatic Fringe Pattern Analysis For Holographic Measurement Of Transient Event", Proc. SPIE 1026, Holography Techniques and Applications, (31 March 1989); https://doi.org/10.1117/12.950232
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Cited by 5 scholarly publications.
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KEYWORDS
Fourier transforms

Fringe analysis

Surface plasmons

Holography

Holograms

Sensors

Diffraction

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