An Accurate Method For Measuring The Spatial Resolution Of Integrated Image Sensors

J. Glasser; J. Vaillant; F. Chazallet

doi:10.1117/12.950257

2 March 1989 An Accurate Method For Measuring The Spatial Resolution Of Integrated Image Sensors

J. Glasser, J. Vaillant, F. Chazallet

Proceedings Volume 1027, Image Processing II; (1989) https://doi.org/10.1117/12.950257
Event: 1988 International Congress on Optical Science and Engineering, 1988, Hamburg, Germany

Abstract

A reasonably simple and accurate method for measuring the spatial resolution of discrete photoelement image sensors was developed. It uses a scanning knife edge as an input pattern. This approach, which is based on rigourous theoretical considerations, gives quicker and more reliable results than the the usual bar pattern method. In addition, it can be fully automated.

Citation Download Citation

J. Glasser, J. Vaillant, and F. Chazallet "An Accurate Method For Measuring The Spatial Resolution Of Integrated Image Sensors", Proc. SPIE 1027, Image Processing II, (2 March 1989); https://doi.org/10.1117/12.950257

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