Z-scan technique for nonlinear materials characterization

Eric W. Van Stryland; Mansoor Sheik-Bahae

doi:10.1117/12.279853

30 July 1997 Z-scan technique for nonlinear materials characterization

Eric W. Van Stryland, Mansoor Sheik-Bahae

Proceedings Volume 10291, Materials Characterization and Optical Probe Techniques: A Critical Review; 102910Q (1997) https://doi.org/10.1117/12.279853
Event: Optical Science, Engineering and Instrumentation '97, 1997, San Diego, CA, United States

Abstract

We review Z-scan and related techniques for the measurement of the nonlinear optical properties of materials. The Z-scan is a simple technique for measuring the change in phase induced on a laser beam upon propagation through a nonlinear material it gives both the sign and magnitude of this phase change, ΔΦ, which is simply related to the change in index of refraction, An. Additionally, a Z-scan can also separately determine the change in transmission caused by nonlinear absorption that is related to the change in the absorption coefficient, Aa. Importantly, the determination of the nonlinear refraction from Δn is independent of the determination of the nonlinear absorption from Δα, within a quite broad range of these parameters. Thus, for third-order nonlinear responses the real and imaginary parts of the third-order nonlinear susceptibility, χ⁽³⁾ can be measured. However, Z-scan is sensitive to any nonlinear processes which result in Δα or Δn, so that great care must be taken in interpreting data taken with this or any other nonlinear materials characterization technique.

Citation Download Citation

Eric W. Van Stryland and Mansoor Sheik-Bahae "Z-scan technique for nonlinear materials characterization", Proc. SPIE 10291, Materials Characterization and Optical Probe Techniques: A Critical Review, 102910Q (30 July 1997); https://doi.org/10.1117/12.279853

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