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We present an inherently phased synthetic aperture microscopy method to mitigate speckle noise and frame- phasing-related issues affecting existing systems that employ coherent illumination for maximum phase sensitivity. Instead of digital holography, our method uses a vibration-insensitive, common-path, phase-shifting shearing interferometer to detect the phase gradient vector and the amplitude of the optical field at the image plane of the microscope. The stability of the speckle field seen by the sensor allows coherent speckle compensation. For demonstration, we show speckle-free super-resolved reconstructions of polystyrene beads in index matching microscope oil.
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