Using a pattern-based approach to detect all IP Blocks used provides the foundry advanced capabilities to analyze them further for any kind of changes which could void the OPC and process window optimizations. Having any changes in an IP Block could cause functionality changes or even failures. This also opens the foundry to legal and cost issues while at the same time forcing re-spins of the design. In this publication, we discuss the methodology we have employed to avoid process issues and tape-out errors while at the same time reduce our manual work and improve the turnaround time. We are also able to use our pattern analysis to improve our OPC optimizations when modifications are encountered which have not been seen before. |
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Optical proximity correction
Databases
Silicon
System on a chip
Tolerancing
Error analysis
Integrated circuit design