Optoelectronic measurement system for testing the optical parameters of infrared seeker

Wenjun He; Zhiying Liu; Yuegang Fu

doi:10.1117/12.2286217

12 January 2018 Optoelectronic measurement system for testing the optical parameters of infrared seeker

Wenjun He, Zhiying Liu, Yuegang Fu

Proceedings Volume 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems; 106210T (2018) https://doi.org/10.1117/12.2286217
Event: International Conference on Optical Instruments and Technology 2017, 2017, Beijing, China

Abstract

We propose an optoelectronic measurement system for testing the optical parameters of infrared seeker, such as the position of the image plane, the size of the diffused spot, and the diameter of the scanning circle. The measurement method and operating principle of the optoelectronic measurement system have been introduced. The source of the stray light in the optoelectronic measurement system have been analyzed by using FRED software, and the stray light have been restricted effectively by a co-centered mica plate which closes to the substrate of pinhole. Experimental results show that the test error for the size of the diffused spot is less than ±0.01 mm, the test errors for the position of the image plane and the diameter of the scanning circle are less than ±0.02 mm.

Citation Download Citation

Wenjun He, Zhiying Liu, and Yuegang Fu "Optoelectronic measurement system for testing the optical parameters of infrared seeker", Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 106210T (12 January 2018); https://doi.org/10.1117/12.2286217

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