Presentation + Paper
18 August 2018 Multi-path interferometer structures with cleaved silica microspheres
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Abstract
Two multi-path interferometers were developed using cleaved silica microspheres. A microsphere on top of a singlemode fiber tip was cleaved with a focused ion beam. The asymmetry introduced in the structure generates a new set of optical paths due to random reflections inside the microsphere. The obtained reflection spectrum presents a random-like interferometric behavior with strong spectral modulation of around 3 dB amplitude. Two distinct regions can be observed when a fast Fourier transform is applied. The first involves two cavities at a lower frequency and the second region involves a band of frequencies that is originated by the random interferometric reflections. These two spectral characteristics can be separated using low-pass and high-pass filters, respectively. A correlation method was used to obtain a temperature response from the two-cavity component. A similar structure was also created in a microsphere of multimode fiber. The microsphere was cleaved by polishing the structure with a certain angle. The interference between the different optical paths can be seen as the superposition of several two-wave interferometers, which can be discriminated through signal processing. Temperature sensing was also explored with this structure. The sensitivity to temperature is more than 3-fold for smaller cavities. Moreover, a sensitivity enhancement is also verified if a correlation method is used.
Conference Presentation
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
André D. Gomes, Beatriz Silveira, Fatemeh Karami, Mohammad I. Zibaii, Hamid Latifi, Jan Dellith, Martin Becker, Manfred Rothhardt, Hartmut Bartelt, and Orlando Frazão "Multi-path interferometer structures with cleaved silica microspheres ", Proc. SPIE 10749, Interferometry XIX, 107490O (18 August 2018); https://doi.org/10.1117/12.2319082
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KEYWORDS
Interferometry

Interferometers

Ion beams

Silica

Temperature metrology

Fourier transforms

Modulation

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