We demonstrate this process by fabricating titania woodpile structures with lateral dimensions of 70 × 70 μm and lateral periodicities between 1.0 and 1.3 μm. Fourier Transform Infrared (FTIR) spectroscopy reveals passive tuning of the reflectance peak between 1.7 and 2.3 μm, which agrees with Plane Wave Expansion simulations. This titania AM process offers a promising pathway to efficiently fabricate complex 3D nano-architectures out of a high-index material for 3D dielectric photonic crystals in the visible and the infrared. |
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Reflectivity
Additive manufacturing
Photonic crystals
FT-IR spectroscopy
Scanning electron microscopy
Titanium
Raman spectroscopy