Profile measurements using contrast-encoded pattern projections

Nai-Jen Cheng; Sih-Yue Chen; Wei-Hung Su

doi:10.1117/12.2530714

9 September 2019 Profile measurements using contrast-encoded pattern projections

Nai-Jen Cheng, Sih-Yue Chen, Wei-Hung Su

Proceedings Volume 11123, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XIII; 111230U (2019) https://doi.org/10.1117/12.2530714
Event: SPIE Optical Engineering + Applications, 2019, San Diego, California, United States

Abstract

A contrast-encoded method based on the phase-shifting technique for 3D shape measurements is presented. Phase extraction is performed by the phase-shifting technique, while unwrapping is discerned by the quaternary contrastencoded patterns. There is no need to take additional projections for phase unwrapping. The fringe patterns used for phase extraction can be analyzed for unwrapping directly. This makes it more efficient to perform high speed, real time, and low cost 3-D shape measurements.

Citation Download Citation

Nai-Jen Cheng, Sih-Yue Chen, and Wei-Hung Su "Profile measurements using contrast-encoded pattern projections", Proc. SPIE 11123, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XIII, 111230U (9 September 2019); https://doi.org/10.1117/12.2530714

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