3D shape measurement by two-steps temporal phase unwrapping: hybrid method

Jorge L. Flores; Adriana Silva; Jose A. Ferrari; Antonio Muñoz; G. García-Torales; Jesus Villa

doi:10.1117/12.2530466

9 September 2019 3D shape measurement by two-steps temporal phase unwrapping: hybrid method

Jorge L. Flores, Adriana Silva, Jose A. Ferrari, Antonio Muñoz, G. García-Torales, Jesus Villa

Author Affiliations +

Proceedings Volume 11128, Infrared Remote Sensing and Instrumentation XXVII; 1112813 (2019) https://doi.org/10.1117/12.2530466
Event: SPIE Optical Engineering + Applications, 2019, San Diego, California, United States

Abstract

In fringe projection profilometry, temporal phase unwrapping is an essential procedure to recover an unambiguous absolute phase even in the presence of large discontinuities or spatially isolated surfaces. In this work, a dual-sensitivity profilometry technique is presented, which is based on defocused projection of binary and sinusoidal fringe patterns with a high and low-frequency spatial carrier, respectively. The binary defocusing techniques (based on PWM or square-wave profile patterns, whose pitch is relatively narrow) have demonstrated successful for high-quality three-dimensional shape measurement when the projector presents a nonlinear response. But they suffer if pitch fringe is wide. On the other hand, using dual sensitivity profilometry, the quality of the unwrapped phase is determined by the high-frequency carrier. Thus, working with only one binary pattern, one can use a single defocusing level (low) in order to reduce the data acquisition time and maintain the quality of the unwrapped phase. Experimental results are presented to verify the success of the proposed method.

Citation Download Citation

Jorge L. Flores, Adriana Silva, Jose A. Ferrari, Antonio Muñoz, G. García-Torales, and Jesus Villa "3D shape measurement by two-steps temporal phase unwrapping: hybrid method", Proc. SPIE 11128, Infrared Remote Sensing and Instrumentation XXVII, 1112813 (9 September 2019); https://doi.org/10.1117/12.2530466

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KEYWORDS

Binary data

Fringe analysis

3D metrology

Projection systems

Modulation

Cameras

Phase shift keying

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