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11 March 2020 Metrology and standardization problems in 3D quantitative phase imaging (Conference Presentation)
Malgorzata Kujawinska
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Proceedings Volume 11249, Quantitative Phase Imaging VI; 112490F (2020) https://doi.org/10.1117/12.2550328
Event: SPIE BiOS, 2020, San Francisco, California, United States
Abstract
At first the SotA in the field ODT and its applications will be presented. Next the main metrological aspects of tomographic algorithms and holographic tomography systems will be discussed. The comparison metrological parameters of these algorithms and systems (resolution, accuracy of retrieved morphology and absolute RI value) will be provided and discussed based on measurements of the calibrated 3D phase phantom. Also the influence of sample preparation protocols on the quantitative determination of RI is discussed. Finally the efforts towards standardization of holographic data compression for the cases with time laps holographic microscopy and holographic tomography will be introduced.
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Malgorzata Kujawinska "Metrology and standardization problems in 3D quantitative phase imaging (Conference Presentation)", Proc. SPIE 11249, Quantitative Phase Imaging VI, 112490F (11 March 2020); https://doi.org/10.1117/12.2550328
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KEYWORDS
3D metrology
Metrology
Tomography
3D image processing
Holography
Phase imaging
3D imaging standards
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