Fundamental limitations of ultra-flat resonant dielectric metasurfaces

Carlo Gigli; Pierre Chavel; Philippe Lalanne

doi:10.1117/12.2550172

26 February 2020 Fundamental limitations of ultra-flat resonant dielectric metasurfaces

Carlo Gigli, Pierre Chavel, Philippe Lalanne

Proceedings Volume 11290, High Contrast Metastructures IX; 112900U (2020) https://doi.org/10.1117/12.2550172
Event: SPIE OPTO, 2020, San Francisco, California, United States

Abstract

There are two physical effects that are exploited nowadays to implement flat metalenses requiring 2𝜋-phase excursion, either subwavelength guidance implementing varying propagation delays, or resonant confinement combining two resonances. We compare both approaches and identify possible limitations with the second approach.

Citation Download Citation

Carlo Gigli, Pierre Chavel, and Philippe Lalanne "Fundamental limitations of ultra-flat resonant dielectric metasurfaces", Proc. SPIE 11290, High Contrast Metastructures IX, 112900U (26 February 2020); https://doi.org/10.1117/12.2550172

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