Paper
1 December 1989 Characterization Of Langmuir-Blodgett Layers And Other Ultrathin Films Using Polarization Modulated FTIR Spectroscopy
T. Buffeteau, B. Desbat, J. M. Turlet
Author Affiliations +
Proceedings Volume 1145, 7th Intl Conf on Fourier Transform Spectroscopy; (1989) https://doi.org/10.1117/12.969459
Event: Seventh International Conference on Fourier and Computerized Infrared Spectroscopy, 1989, Fairfax, VA, United States
Abstract
Polarization Modulated Reflexion Absorption Infra-Red Spectroscopy (PM-IRRAS) is a very sensitive method to analyse in situ and non-destructively adsorbates and ultrathin molecular films, as for instance, a single Langmuir-Blodgett (LB) layer. Extended experimental conditions and preliminary results demonstrating this high surface absorption detectivity, have been already published 1-3. In this communication, we want to stress on two important points that have been very often neglected : the quantitative analysis of PM-IRRAS spectra and the extension of this method to nonmetallic substrates.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
T. Buffeteau, B. Desbat, and J. M. Turlet "Characterization Of Langmuir-Blodgett Layers And Other Ultrathin Films Using Polarization Modulated FTIR Spectroscopy", Proc. SPIE 1145, 7th Intl Conf on Fourier Transform Spectroscopy, (1 December 1989); https://doi.org/10.1117/12.969459
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KEYWORDS
Spectroscopy

Dielectric polarization

Modulation

Absorption

FT-IR spectroscopy

Phase modulation

Semiconductors

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