Paper
15 January 1989 Recent Developments In Growth And Characterization Of Thin Diamond Films
R. W. Pryor, R. L. Thomas, P. K. Kuo, L. D. Favro
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Abstract
Many different process and deposition equipment technologies have been developed worldwide for the deposition of thin diamond films. The diamond films that result from these technologies are, in general, polycrystalline and differ primarily in nucleation density, growth rate, crystallite size, non-diamond carbon content, etc. This paper reviews, briefly, the primary technologies and their resulting films. The primary focus of this paper is, however, the presentation of a methodology for the determination of the relative quality of diamond materials, both bulk and film. The methodology presented utilizes a combination of measurements from the mirage effect (Thermal Wave Technique) and the raman effect. This paper reviews, briefly, both techniques and their resulting data. Results are presented that show an excellent correlation between the thermal diffusivity and the graphitic content of thin diamond films.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. W. Pryor, R. L. Thomas, P. K. Kuo, and L. D. Favro "Recent Developments In Growth And Characterization Of Thin Diamond Films", Proc. SPIE 1146, Diamond Optics II, (15 January 1989); https://doi.org/10.1117/12.962063
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Cited by 7 scholarly publications.
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KEYWORDS
Diamond

Chemical vapor deposition

Thin films

Raman spectroscopy

Carbon

Microwave radiation

Electronics

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