Presentation
20 August 2020 Deep learning-enabled resolution enhancement of scanning electron microscopy images
Author Affiliations +
Abstract
We present a deep learning-based framework to perform single image super-resolution of SEM images. We experimentally demonstrated that this network can enhance the resolution of SEM images by two-fold, allowing for a reduction of the scanning time and electron dosage by four-fold without any significant loss of image quality. Using blindly tested regions of a gold-on-carbon resolution test target, we quantitatively and qualitatively confirmed the image enhancement achieved by the trained network. We believe that this technique has the potential to improve the SEM imaging process, particularly in cases where imaging throughput and minimizing beam damage are of utmost importance.
Conference Presentation
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kevin de Haan, Zachary S. Ballard, Yair Rivenson, Yichen Wu, and Aydogan Ozcan "Deep learning-enabled resolution enhancement of scanning electron microscopy images", Proc. SPIE 11469, Emerging Topics in Artificial Intelligence 2020, 114690P (20 August 2020); https://doi.org/10.1117/12.2567504
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KEYWORDS
Scanning electron microscopy

Image resolution

Resolution enhancement technologies

Image enhancement

Electron beams

Image quality

Nanoparticles

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