Radiometric diffraction corrections in remote-sensing applications

Eric L. Shirley

doi:10.1117/12.2569126

20 August 2020 Radiometric diffraction corrections in remote-sensing applications

Eric L. Shirley

Proceedings Volume 11502, Infrared Remote Sensing and Instrumentation XXVIII; 115020E (2020) https://doi.org/10.1117/12.2569126
Event: SPIE Optical Engineering + Applications, 2020, Online Only

Abstract

Diffraction corrections are required in radiometric measurements in remote sensing. In this work, I will discuss the capabilities that we have developed to calculate them accurately and efficiently. Several aspects will be considered, namely, (1.) diffraction effects for a single aperture, for spectral power and total power in the case of radiation thermometry, including asymptotic behavior a small wavelengths and high temperatures; (2.) diffraction effects specific to multi-staged optics trains; (3.) applications in remote-sensing applications in test chambers use to simulate observation of remote objects in outer space; and (4.) solar radiometry.

Conference Presentation

Citation Download Citation

Eric L. Shirley "Radiometric diffraction corrections in remote-sensing applications", Proc. SPIE 11502, Infrared Remote Sensing and Instrumentation XXVIII, 115020E (20 August 2020); https://doi.org/10.1117/12.2569126

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