Fast-Scan Spectroradiometry

Gilbert Gaussorgues; Thierry Campos; Dag Holmsten

doi:10.1117/12.978617

8 January 1990 Fast-Scan Spectroradiometry

Gilbert Gaussorgues, Thierry Campos, Dag Holmsten

Proceedings Volume 1157, Infrared Technology XV; (1990) https://doi.org/10.1117/12.978617
Event: 33rd Annual Technical Symposium, 1989, San Diego, United States

Abstract

In the field of infrared spectroradiometry there are several systems available, of which a large majority is intended for measurements on relatively stable radiation sources. Such type of equipment is perfectly suitable for the task of determining spectral radiometric characteristics (emissivity; transmission and reflection coefficients) of specific material samples in a laboratory. Their utility, however, becomes limited when used to analyze rapid events especially out in the field, due to the equipments' (low) speed of acquisition and mechanical overall design.

Citation Download Citation

Gilbert Gaussorgues, Thierry Campos, and Dag Holmsten "Fast-Scan Spectroradiometry", Proc. SPIE 1157, Infrared Technology XV, (8 January 1990); https://doi.org/10.1117/12.978617

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available