Power meters and fluorescence intensity monitors as intensity diagnostics in the LCLS-II X-ray instruments

Philip A. Heimann; Stefan P. Moeller; Matthew H. Seaberg; Peter Walter; William F. Schlotter; David Fritz; Andrey Sorokin; Fini Jastrow; Kai Tiedtke; Takahiro Tanaka

doi:10.1117/12.2589188

18 April 2021 Power meters and fluorescence intensity monitors as intensity diagnostics in the LCLS-II X-ray instruments

Philip A. Heimann, Stefan P. Moeller, Matthew H. Seaberg, Peter Walter, William F. Schlotter, David Fritz, Andrey Sorokin, Fini Jastrow, Kai Tiedtke, Takahiro Tanaka

Author Affiliations +

Proceedings Volume 11776, EUV and X-ray Optics, Sources, and Instrumentation; 117760P (2021) https://doi.org/10.1117/12.2589188
Event: SPIE Optics + Optoelectronics, 2021, Online Only

Abstract

For LCLS-II, we have developed fluorescence intensity monitors and power meters as intensity monitors. The Fluorescence Intensity Monitor (FIM) provides the non-invasive, pulse-by-pulse normalization of experiments. For the LCLS-II instruments, the diagnostic was constructed with an array of four microchannel plate assemblies and four avalanche photodiodes. The diagnostics are being installed in each Kirkpatrick Baez mirror chamber. The noise of the diagnostic will be evaluated against a goal of 1 %. The X-ray power meter delivers average power values. For the LCLS-II instruments, a power meter was selected compatible with high average power. In the LCLS-II instruments, power meters are being installed with each profile monitor in order to evaluate the transmission along the X-ray transport. A calibration of a set of power meters was carried out against a gas monitor detector at FLASH. In addition for all the power meters, a relative calibration was performed with a visible light source. At the endstations, a power meter will determined the pulse energy at the sample.

Conference Presentation

Citation Download Citation

Philip A. Heimann, Stefan P. Moeller, Matthew H. Seaberg, Peter Walter, William F. Schlotter, David Fritz, Andrey Sorokin, Fini Jastrow, Kai Tiedtke, and Takahiro Tanaka "Power meters and fluorescence intensity monitors as intensity diagnostics in the LCLS-II X-ray instruments", Proc. SPIE 11776, EUV and X-ray Optics, Sources, and Instrumentation, 117760P (18 April 2021); https://doi.org/10.1117/12.2589188

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available