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Optical non-contact surface texture measurement is of great value in terms of high speed and non-invasiveness. The purpose of this study is to obtain accurate surface roughness information using an optical non-contact method. We propose a new method to accurately acquire the surface roughness parameter with the scattered light intensity distribution. The roughness parameter Rq was determined using the generalized Harvey-Shack (GHS) theory. Furthermore, the roughness parameter R▵q was estimated from the argument ”a” of the K-correlation model. The results using the proposed non-contact method were in good agreement with the conventional contact method in most cases.
Yoshitaka Igarashi,Toshiyasu Mitsunari, andKazunori Yamazaki
"Surface roughness measurement using the generalized Harvey-Shack scattering theory and the K-correlation model", Proc. SPIE 11782, Optical Measurement Systems for Industrial Inspection XII, 117821S (20 June 2021); https://doi.org/10.1117/12.2592020
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Yoshitaka Igarashi, Toshiyasu Mitsunari, Kazunori Yamazaki, "Surface roughness measurement using the generalized Harvey-Shack scattering theory and the K-correlation model," Proc. SPIE 11782, Optical Measurement Systems for Industrial Inspection XII, 117821S (20 June 2021); https://doi.org/10.1117/12.2592020