Poster + Presentation
9 October 2021 An ultracompact high-resolution displacement sensor based on self-interference effect of single optical nanograting
Author Affiliations +
Conference Poster
Abstract
Benefitting from properties including high sensitivity, high resolution, immunity to electromagnetic interference and remote sensing ability, optical-grating-based displacement measuring technologies have been widely used in many fields such as semiconductor manufacturing, precision machining, microscopic techniques and photolithography recently. In this work, high-resolution displacement measuring is demonstrated with an ultracompact structure consist of only a few optical components by using self-interference effect of a single nanograting. The resolution is demonstrated to be as low as 0.1-nm level. This method shows great potential in developing miniaturized high-resolution displacement devices and systems, which are highly demanded for future integrated high-precision machinery manufacturing systems.
Conference Presentation
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jie Qi and Chenguang Xin "An ultracompact high-resolution displacement sensor based on self-interference effect of single optical nanograting", Proc. SPIE 11898, Holography, Diffractive Optics, and Applications XI, 118981K (9 October 2021); https://doi.org/10.1117/12.2600368
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Sensors

Singular optics

Diffraction

Beam splitters

Digital electronics

Doppler effect

Mirrors

RELATED CONTENT


Back to Top