Benefitting from properties including high sensitivity, high resolution, immunity to electromagnetic interference and remote sensing ability, optical-grating-based displacement measuring technologies have been widely used in many fields such as semiconductor manufacturing, precision machining, microscopic techniques and photolithography recently. In this work, high-resolution displacement measuring is demonstrated with an ultracompact structure consist of only a few optical components by using self-interference effect of a single nanograting. The resolution is demonstrated to be as low as 0.1-nm level. This method shows great potential in developing miniaturized high-resolution displacement devices and systems, which are highly demanded for future integrated high-precision machinery manufacturing systems.
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