A chip-level 400G integrated coherent receiver optical-electronic testing system

Xun Lei; Quan Cao; Shichao Zhu; Sheng Yu; Luluzi Lu; Yongpeng Cheng; Hao Jiang

doi:10.1117/12.2606619

24 November 2021 A chip-level 400G integrated coherent receiver optical-electronic testing system

Xun Lei, Quan Cao, Shichao Zhu, Sheng Yu, Luluzi Lu, Yongpeng Cheng, Hao Jiang

Proceedings Volume 12066, AOPC 2021: Micro-optics and MOEMS; 120661C (2021) https://doi.org/10.1117/12.2606619
Event: Applied Optics and Photonics China 2021, 2021, Beijing, China

Abstract

We present a 400G chip level Integrated Coherent Receiver optical-electronic testing system. The testing system shows high repeatability and high accuracy compared with commercial device testing system. Besides, we also achieve Graphical User Interface automated testing based on the system, which is high-efficiency for screening qualified chips or devices.

Citation Download Citation

Xun Lei, Quan Cao, Shichao Zhu, Sheng Yu, Luluzi Lu, Yongpeng Cheng, and Hao Jiang "A chip-level 400G integrated coherent receiver optical-electronic testing system", Proc. SPIE 12066, AOPC 2021: Micro-optics and MOEMS, 120661C (24 November 2021); https://doi.org/10.1117/12.2606619

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