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29 August 2022 MOONS – Multi Object spectroscopy for the VLT: design and testing of the MOONS metrology system
Oscar A. Gonzalez, Ciaran Breen, Jorge Sepulveda, Tzu-Chiang Shen, Phil Rees, Alexandre Cabral, Martin Black, Ian Bryson, Michele Cirasuolo, Steven Beard, Stephen Chittick, Manuel Parra, Alexis Tejeda, Leonardo Vanzi, Stephen Watson, Manuela Zoccali
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Proceedings Volume 12188, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation V; 121883S (2022) https://doi.org/10.1117/12.2629946
Event: SPIE Astronomical Telescopes + Instrumentation, 2022, Montréal, Québec, Canada
Abstract
MOONS is the Multi-Object Optical and Near-IR Spectrograph to be mounted at a Nasmyth focus at the Very Large Telescope. The instrument is equipped with 1000 fibres configured over a field of view of ~500 square arcmin using theta-phi fibre positioning units (FPUs). The MOONS metrology system must accurately determine the position of the fibres in the focal plate, providing fast feedback to the instrument control software during operations. The returned fibre positions can be used for calibrations of the FPUs or fast system recovery after a power loss. If required, the system can also be used for calculating fine adjustments of the fibre positions during acquisition. In this paper, a description of the system design, implementation, and testing in the MOONS focal plate are provided. The presented system has high potential for adaptation to a variety of astronomical instrument applications during integration, testing, and operation stages.
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Oscar A. Gonzalez, Ciaran Breen, Jorge Sepulveda, Tzu-Chiang Shen, Phil Rees, Alexandre Cabral, Martin Black, Ian Bryson, Michele Cirasuolo, Steven Beard, Stephen Chittick, Manuel Parra, Alexis Tejeda, Leonardo Vanzi, Stephen Watson, and Manuela Zoccali "MOONS – Multi Object spectroscopy for the VLT: design and testing of the MOONS metrology system", Proc. SPIE 12188, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation V, 121883S (29 August 2022); https://doi.org/10.1117/12.2629946
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KEYWORDS
Metrology
Calibration
3D metrology
Commercial off the shelf technology
Imaging systems
Photogrammetry
Target detection
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