Reflectivity characterization of various black and white materials

Luke M. Schmidt; Brant Conway; Darren L. DePoy; Jennifer L. Marshall; Ryan J. Oelkers

doi:10.1117/12.2630244

29 August 2022 Reflectivity characterization of various black and white materials

Luke M. Schmidt, Brant Conway, Darren L. DePoy, Jennifer L. Marshall, Ryan J. Oelkers

Proceedings Volume 12188, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation V; 121884W (2022) https://doi.org/10.1117/12.2630244
Event: SPIE Astronomical Telescopes + Instrumentation, 2022, Montréal, Québec, Canada

Conference Poster

Abstract

We report on an expanded catalog1–4 of various common (and uncommon) black and white materials used in the construction and/or baffling of optical systems and as screen material for calibration systems. Total reflectance is measured over a broad wavelength range (250 nm < λ < 2500 nm) that is applicable to ultraviolet, visible, and near-infrared instrumentation. Reflectivity data for the complete sample inventory will be available via Filtergraph, an online data visualization tool.

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Luke M. Schmidt, Brant Conway, Darren L. DePoy, Jennifer L. Marshall, and Ryan J. Oelkers "Reflectivity characterization of various black and white materials", Proc. SPIE 12188, Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation V, 121884W (29 August 2022); https://doi.org/10.1117/12.2630244

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