Presentation + Paper
3 October 2022 Phase-shifting projected fringe profilometry by binary-encoded projections
Author Affiliations +
Abstract
A binary encoding algorithm is presented for phase-shifting projected fringe profilometry. It does not require additional projections to identify fringe orders. The pattern used for phase extraction can be used for phase unwrapping directly. Fringes can be discerned even though the surface color or reflectivity varies with positions.
Conference Presentation
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wei-Hung Su and Nai-Jen Cheng "Phase-shifting projected fringe profilometry by binary-encoded projections", Proc. SPIE 12229, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XVI, 1222909 (3 October 2022); https://doi.org/10.1117/12.2632370
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KEYWORDS
Phase shifts

Binary data

Fringe analysis

Inspection

Reflectivity

Image sensors

Imaging arrays

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