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Oscillating microelectromechanical systems (MEMS) devices can manipulate synchrotron x-ray beams at ultrafast rates. By selectively diffracting x-rays, these devices can “pick” or even “slice” x-ray pulses from a beam; diffractive time windows less than 1 ns have been demonstrated. Here we demonstrate the use of MEMS devices to produce modulated x-ray beams with a high x-ray throughput that modify the timing structure of a synchrotron beam, which can be applied to perform time-resolved x-ray diffraction experiments.
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Donald A. Walko, Jinxing Jiang, Jian Zhou, Burak Guzelturk, Xiaoyi Zhang, David A. Czaplewski, Jin Wang, "Measuring the x-ray flux from MEMS devices for timing applications," Proc. SPIE 12240, Advances in X-Ray/EUV Optics and Components XVII, 1224009 (4 October 2022); https://doi.org/10.1117/12.2633137