PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
Steering x-ray beams from the source towards the experiment without distorting their wavefront defines extraordinary high-quality requirements on the production of the x-ray optics. We report on how this demand settled with in situ shot-to-shot wavefront sensing optimization of KB optics at SwissFEL beamlines. This contribution presents methodology that combines moir´e interferometry and single-phase-grating Talbot interferometry. We discuss an online Kirkpatrick-Baez (KB) test plan at the Cristallina beamline based on single phase grating Talbot interferometry, demonstrating progressive optimization steps in minimizing KB wavefront distortion.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
The alert did not successfully save. Please try again later.
J. Krempaský, J. Vonka, B. Pedrini, A. Steppke, U. Flechsig, R. Follath, B. Rösner, U. H. Wagner, C. David, M. Makita, P. Vagović, "SwissFEL KB-optics at-wavelength wavefront characterisation," Proc. SPIE 12581, X-Ray Free-Electron Lasers: Advances in Source Development and Instrumentation VI, 125810A (16 June 2023); https://doi.org/10.1117/12.2665587