Rapid surface metrology of freeform shapes using CGH interferometry

Edward LaVilla; James H. Burge; Shelby D. V. Ament; Jake Beverage; Tyler Steele; Chunyu Zhao

doi:10.1117/12.2673870

15 August 2023 Rapid surface metrology of freeform shapes using CGH interferometry

Edward LaVilla, James H. Burge, Shelby D. V. Ament, Jake Beverage, Tyler Steele, Chunyu Zhao

Proceedings Volume 12618, Optical Measurement Systems for Industrial Inspection XIII; 126182U (2023) https://doi.org/10.1117/12.2673870
Event: SPIE Optical Metrology, 2023, Munich, Germany

Conference Poster

Abstract

The need for rapid, high resolution, accurate metrology of mass produced aspheric and freeform surfaces continues to grow as the application space evolves. Expanding the use cases of standard interferometers, computer generated holograms enable snapshot, megapixel resolution measurements of freeform surfaces that may have large and non-symmetric departure from spherical. CGH metrology at production scales can be realized without specialized engineers or in-house knowledge of setup. In this paper, we highlight the impact of the CGH vendor to provide not only a hologram but a suite of hardware to streamline high volume aspheric and freeform metrology. Alignment becomes straightforward, data acquisition remains standard to the interferometer and data is processed automatically. Early integration of this metrology solution in product planning helps users scale from prototype to manufacture.

Citation Download Citation

Edward LaVilla, James H. Burge, Shelby D. V. Ament, Jake Beverage, Tyler Steele, and Chunyu Zhao "Rapid surface metrology of freeform shapes using CGH interferometry", Proc. SPIE 12618, Optical Measurement Systems for Industrial Inspection XIII, 126182U (15 August 2023); https://doi.org/10.1117/12.2673870

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