Presentation + Paper
4 October 2023 Absolute polarimetric calibration of the retardance of a liquid crystal on silicon microdisplay
Author Affiliations +
Abstract
The phase-shift exhibited by liquid crystal on silicon devices (LCoS) depends on the voltage applied and the illumination wavelength. Most of the LCoS used in the labs are digitally addressed using a binary pulse width modulated signal. Usually, these devices are characterized for a very small range of the available binary voltage values and for specific wavelengths. In this work, we consider a commercial parallel-aligned liquid crystal on silicon device (PA-LCoS) in which the binary voltages are accessible through the software of the vendor. We perform a complete averaged Stokes polarimetric characterization of the device where we are able to obtain the absolute unwrapped retardance values for a wide range of voltage parameters and across the visible spectrum. This provides a practical approach to evaluate the whole range of phase modulation possibilities, and to analyze some issues related with the physics of the device.
Conference Presentation
(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.
A. R. Sánchez-Montes, A. Márquez, J. Francés, F. J. Martínez-Guardiola, E. M. Calzado, S. Gallego, I. Pascual, and A. Beléndez "Absolute polarimetric calibration of the retardance of a liquid crystal on silicon microdisplay", Proc. SPIE 12673, Optics and Photonics for Information Processing XVII, 126730A (4 October 2023); https://doi.org/10.1117/12.2672547
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KEYWORDS
Liquid crystals

Liquid crystal on silicon

Polarimetry

Modulation

Binary data

Refractive index

Spatial light modulators

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