Design and characterization of x-ray diagnostics for the cavity-based x-ray free-electron laser project

Peifan Liu; Paresh Pradhan; Antonino Miceli; Donald A. Walko; Deming Shu; Joseph Sullivan; Keenan Lang; Mark Rivers; Diling Zhu; Aliaksei Halavanau; Yuri Shvyd'ko

doi:10.1117/12.2677209

3 October 2023 Design and characterization of x-ray diagnostics for the cavity-based x-ray free-electron laser project

Peifan Liu, Paresh Pradhan, Antonino Miceli, Donald A. Walko, Deming Shu, Joseph Sullivan, Keenan Lang, Mark Rivers, Diling Zhu, Aliaksei Halavanau, Yuri Shvyd'ko

Author Affiliations +

Proceedings Volume 12694, Advances in X-Ray/EUV Optics and Components XVIII; 126940D (2023) https://doi.org/10.1117/12.2677209
Event: SPIE Optical Engineering + Applications, 2023, San Diego, California, United States

Abstract

A cavity-based x-ray free-electron laser (CBXFEL) is a possible future direction in the development of fully coherent x-ray sources. One of the challenges of a CBXFEL is the requirement of the three-dimensional overlapping of the μm-sized electron beam with the circulating μm-sized x-ray beam in an x-ray cavity of tens or hundreds of meters long. In the framework of the CBXFEL R&D collaborative project of Argonne National Laboratory, SLAC National Accelerator Laboratory, and Spring-8, we present here the development of an x-ray diagnostics system for an accurate alignment of x-ray beams in the CBXFEL cavity. All the designed diagnostics components have been fully characterized at the Advanced Photon Source to demonstrate a sub-μrad-angular and μm-spatial alignment accuracy for the CBXFEL cavity.

Conference Presentation

(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Peifan Liu, Paresh Pradhan, Antonino Miceli, Donald A. Walko, Deming Shu, Joseph Sullivan, Keenan Lang, Mark Rivers, Diling Zhu, Aliaksei Halavanau, and Yuri Shvyd'ko "Design and characterization of x-ray diagnostics for the cavity-based x-ray free-electron laser project", Proc. SPIE 12694, Advances in X-Ray/EUV Optics and Components XVIII, 126940D (3 October 2023); https://doi.org/10.1117/12.2677209

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