Compact, high power laser beam CMOS profiler with less than -8 inherent optical density

Michael Scaggs; Gil Haas

doi:10.1117/12.3001839

12 March 2024 Compact, high power laser beam CMOS profiler with less than -8 inherent optical density

Michael Scaggs, Gil Haas

Proceedings Volume 12871, Laser Resonators, Microresonators, and Beam Control XXVI; 128710B (2024) https://doi.org/10.1117/12.3001839
Event: SPIE LASE, 2024, San Francisco, California, United States

Abstract

Employing two novel beam attenuation and ghost suppression schemes, a compact, high-power laser beam CMOS-based profiler has been realized. The traditional method of attenuation employs a multitude of crossed polarized wedge prism pairs along with other mirror and neutral density filters to get the intensity of the laser beam on the CMOS without overexposing the sensor. In general, the CMOS requires low microwatts of power to avoid over exposure of the sensor. This means that for 1 kilowatt of continuous wave laser power, the attenuation, prior to the sensor, needs to be in the -8 to -9 optical density range. A pair of uncoated, fused silica wedge prisms have an equivalent optical density of about -2.8. Therefore, three pairs of wedge prisms would be required for an -8 to -9 optical density equivalent. The implementation of three sets of wedge prisms requires a long optical path with no less than six optics to achieve the desired attenuation. In the current work, the number of optics required is only 3 to achieve the same level of attenuation and is a fraction of the size in contrast to the traditional method.

Conference Presentation

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Michael Scaggs and Gil Haas "Compact, high power laser beam CMOS profiler with less than -8 inherent optical density", Proc. SPIE 12871, Laser Resonators, Microresonators, and Beam Control XXVI, 128710B (12 March 2024); https://doi.org/10.1117/12.3001839

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