Paper
13 May 2024 Development of digital model and analyzation system for typical faults of low voltage DC system
Wei Wang, Liang Chen, Fangbo Xing, Huadong Tang, Yi Li, Fei Xue, Leijie Sun
Author Affiliations +
Proceedings Volume 13159, Eighth International Conference on Energy System, Electricity, and Power (ESEP 2023); 131593C (2024) https://doi.org/10.1117/12.3025057
Event: Eighth International Conference on Energy System, Electricity and Power (ESEP 2023), 2023, Wuhan, China
Abstract
The digital model for the typical faults of low voltage DC system is analyzed, and the analyzation system is developed to offline calculate and pre-analyses whether the fault results in mis-action of the low voltage DC system. Firstly, the digital model for typical faults of low voltage DC is analyzed based on the analytical method, and the mis-action power for typical faults is found. Secondly, the software for verification of the above analysis is developed, and typical cases are used to further verify the correctness and effectiveness of the developed software. In the tested case, the developed software can flexibly pre-analyses the mis-action of low voltage DC system for the targeted typical faults.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Wei Wang, Liang Chen, Fangbo Xing, Huadong Tang, Yi Li, Fei Xue, and Leijie Sun "Development of digital model and analyzation system for typical faults of low voltage DC system", Proc. SPIE 13159, Eighth International Conference on Energy System, Electricity, and Power (ESEP 2023), 131593C (13 May 2024); https://doi.org/10.1117/12.3025057
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KEYWORDS
Relays

Capacitors

Resistors

Capacitance

Chromium

Software development

Systems modeling

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