Total integrated scatter instrument for in-space monitoring of surface degradation

J. Larry Pezzaniti; James B. Hadaway; Russell A. Chipman; Donald R. Wilkes; Lee Hummer; Jean M. Bennett

doi:10.1117/12.22603

1 November 1990 Total integrated scatter instrument for in-space monitoring of surface degradation

J. Larry Pezzaniti, James B. Hadaway, Russell A. Chipman, Donald R. Wilkes, Lee Hummer, Jean M. Bennett

Proceedings Volume 1329, Optical System Contamination: Effects, Measurement, Control II; (1990) https://doi.org/10.1117/12.22603
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

A Total Integrated Scatter (TIS) system was built to test the viability of a TIS instrument to be used in space to monitor damage to optical and thermal control surfaces due to the low earth environment. The systems accuracy and repeatability in detecting changes in the surface quality of various space materials after exposure to atomic oxygen was tested. A method for distinguishing roughening of a surface from dust contamination is described.

Citation Download Citation

J. Larry Pezzaniti, James B. Hadaway, Russell A. Chipman, Donald R. Wilkes, Lee Hummer, and Jean M. Bennett "Total integrated scatter instrument for in-space monitoring of surface degradation", Proc. SPIE 1329, Optical System Contamination: Effects, Measurement, Control II, (1 November 1990); https://doi.org/10.1117/12.22603

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