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1 February 1991 High-resolution stigmatic EUV spectroheliometer for studies of the fine scale structure of the solar chromosphere, transition region, and corona
J. Gethyn Timothy, Thomas E. Berger, Jeffrey S. Morgan, Arthur B. C. Walker II, Jagadish C. Bhattacharyya, Surendra K. Jain, Ajay Kumar Saxena, Martin H.C. Huber, Giuseppe Tondello, Giampiero Naletto
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Proceedings Volume 1343, X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography; (1991) https://doi.org/10.1117/12.23223
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States
Abstract
We describe the design of a high-resolution stigmatic extreme-ultraviolet (EUV) spectroheliometer, configured for flight on a Black Brant sounding rocket, which consists of a 45-cm Gregory telescope coupled to a spectrometer employing a single toroidal diffraction grating in a normal-incidence Rowland circle mounting and an imaging pulse-counting Multi-Anode Microchannel Array (MAMA) detector system. The toroidal diffraction grating is fabricated by a new technique employing an elastically-deformable sub-master grating which is replicated in a spherical form and then mechanically distorted to produce the desired aspect ratio of the toroidal surface for stigmatic imaging over the selected wavelength range. The spectroheliometer will produce spatially-resolved spectra of the chromosphere, transition-region and corona with an angular resolution of 0.4 arc sec or better, a spectral resolution AII of about 1O in first order, and a temporal resolution of the order of seconds. Because of the geometric fidelity of the MAMA detector system, the speciroheliometer will be able to determine Doppler shifts to a resolution of at least 2 mA at wavelengths near 600 A (-1.0 km s1), depending on the level of the accumulated signal. The unique characteristics of the spectroheliometer will be used in combination with plasma-diagnostic techniques to study the temperature, density and velocity structures of specific features in the solar outer atmosphere.
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J. Gethyn Timothy, Thomas E. Berger, Jeffrey S. Morgan, Arthur B. C. Walker II, Jagadish C. Bhattacharyya, Surendra K. Jain, Ajay Kumar Saxena, Martin H.C. Huber, Giuseppe Tondello, and Giampiero Naletto "High-resolution stigmatic EUV spectroheliometer for studies of the fine scale structure of the solar chromosphere, transition region, and corona", Proc. SPIE 1343, X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography, (1 February 1991); https://doi.org/10.1117/12.23223
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KEYWORDS
Extreme ultraviolet
Sensors
Spectroscopy
Diffraction gratings
Imaging systems
Infrared spectroscopy
Calibration
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