Results from the calibration of the Extreme Ultraviolet Explorer instruments

Barry Y. Welsh; Patrick N. Jelinsky; Peter W. Vedder; John V. Vallerga; David S. Finley; Roger F. Malina

doi:10.1117/12.23190

1 February 1991 Results from the calibration of the Extreme Ultraviolet Explorer instruments

Barry Y. Welsh, Patrick N. Jelinsky, Peter W. Vedder, John V. Vallerga, David S. Finley, Roger F. Malina

Proceedings Volume 1343, X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography; (1991) https://doi.org/10.1117/12.23190
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

The paper describes the main features and selected results of the calibration of the scientific instruments to be flown on the Extreme Ultraviolet Explorer in 1991. The instrument payload includes three grazing incidence scanning telescopes and an EUV spectrometer/deep survey instrument covering the spectral region 70-800 A. The measured imaging characteristics, the effective areas, and the details of spectral responses of the instruments are presented. Diagrams of the cross-sectional views of the scanning telescope and the deep-survey/spectrometer telescope are included.

Citation Download Citation

Barry Y. Welsh, Patrick N. Jelinsky, Peter W. Vedder, John V. Vallerga, David S. Finley, and Roger F. Malina "Results from the calibration of the Extreme Ultraviolet Explorer instruments", Proc. SPIE 1343, X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography, (1 February 1991); https://doi.org/10.1117/12.23190

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