Optical image subtraction using electron-trapping materials

Suganda Jutamulia; George M. Storti; William M. Seiderman; Joseph Lindmayer; Don A. Gregory

doi:10.1117/12.23431

27 December 1990 Optical image subtraction using electron-trapping materials

Suganda Jutamulia, George M. Storti, William M. Seiderman, Joseph Lindmayer, Don A. Gregory

Proceedings Volume 1347, Optical Information Processing Systems and Architectures II; (1990) https://doi.org/10.1117/12.23431
Event: 34th Annual International Technical Symposium on Optical and Optoelectronic Applied Science and Engineering, 1990, San Diego, CA, United States

Abstract

An account is given of a novel incoherent-image subtraction technique employing ET materials, which possess no coherent noise, high resolution, gray level, high space-bandwidth product, high speed, and cost-effectiveness. The present ET devices are based on thin films of Ca(x)Sr(1-x)S:Eu, Ce, Sm. Prospective applications of this ET device encompass IC manufacture/inspection, data compression, and high-definition TV. Experimental results are presented.

Citation Download Citation

Suganda Jutamulia, George M. Storti, William M. Seiderman, Joseph Lindmayer, and Don A. Gregory "Optical image subtraction using electron-trapping materials", Proc. SPIE 1347, Optical Information Processing Systems and Architectures II, (27 December 1990); https://doi.org/10.1117/12.23431

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